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The emergence of SoC has been described as a development that will require fundamental changes in the approaches to design-for -testability (DFT). This will take the form of a “test re-use” strategy ...

For much of the lifetime of digital IC engineering, testability has been one of those issues that was somebody else's problem. But with the arrival of the SoC, it has become clear that testability ...

Tokyo Electron Ltd. (TEL) and Teseda Corp. today announced that they have combined efforts for an integrated design for testability (DFT) system. The demonstration system consists of the Wafer Prober ...

Design for testability (DFT) works to make a circuit more testable to ensure that it was manufactured correctly. Alfred Crouch explains the purpose of DFT in his book, Design-For-Test for Digital ICs ...

Many IC designers finally have embraced design for testability (DFT) in the form of scan insertion for digital circuit designs because of the significant time-to-production advantages these techniques ...

Hardware engineers employ all kinds of design reviews and processes, including design for manufacturability and design for testability. It's time software engineers stood up and asked for what they ...

The emergence of SoC has been described as a development that will require fundamental changes in the approaches to design-for -testability (DFT). This will take the form of a "test re-use" strategy ...